Imaging method for serial time-encoded amplified microscope

A new imaging method for serial time-encoded amplified microscope is proposed, which eliminates the impact of spectrum ripples in the non-flat spectrum source and non-uniform gain. It can avoid the waste of low-level amplitude in the pulse edge. The time-space-frequency mapping in the optical time-stretch and amplification in the Dispersion Fourier Transform are demonstrated. A 1550 nm mode-locked pulse laser is used to project the USAF-1951 resolution target line by line, which reflects the potential application in micrometer scale and ultrafast imaging field.