Volume 32 Issue 4
Mar.  2020
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Wang Kai, Lü Xueyang, Wu Kunlin, et al. Effects of different sequential neutron/gamma irradiation on current gain of bipolar devices[J]. High Power Laser and Particle Beams, 2020, 32: 044001. doi: 10.11884/HPLPB202032.190333
Citation: Wang Kai, Lü Xueyang, Wu Kunlin, et al. Effects of different sequential neutron/gamma irradiation on current gain of bipolar devices[J]. High Power Laser and Particle Beams, 2020, 32: 044001. doi: 10.11884/HPLPB202032.190333

Effects of different sequential neutron/gamma irradiation on current gain of bipolar devices

doi: 10.11884/HPLPB202032.190333
  • Received Date: 2019-09-04
  • Rev Recd Date: 2020-01-09
  • Publish Date: 2020-03-06
  • In this paper, CFBR-II fast neutron reactor (China's second fast neutron pulse reactor) and Co-60 device are used to carry out experiments on different sequential neutrons/gamma irradiated bipolar transistors. Under the condition that the collector-emitter voltage is constant, the variation curve of the bipolar transistor current gain with the collector current is measured, and the influence of different irradiation order of neutron/ gamma on the current gain of the bipolar transistor is studied. The experimental results show that when the collector-emitter voltage is constant and the collector current is extremely low, the current gain degradation of the bipolar transistor is relatively large, and the current gain increases with the collector current. The degradation of the current gain of the bipolar transistor caused by the gamma irradiation after the neutron pre-irradiation would be greater than that of the neutron irradiation after the gamma pre-irradiation, and the difference is more obvious in PNP transistor than in NPN transistor. This paper presents a preliminary discussion on the related mechanism.
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  • [1]
    王晨辉, 陈伟, 刘岩, 等. 基区表面势对栅控横向PNP晶体管中子位移损伤的影响[J]. 强激光与粒子束, 2015, 27:114002. (Wang Chenhui, Chen Wei, Liu Yan, et al. Influence of base surface potential on neutron displacement damage of gate-controlled lateral PNP bipolar transistors[J]. High Power Laser and Particle Beams, 2015, 27: 114002 doi: 10.11884/HPLPB201527.114002
    [2]
    Gorelick J L, Ladbury R, Kanchawa L, et al. The effects of neutron irradiation on gamma sensitivity of linear integrated circuits[J]. IEEE Trans Nucl Sci, 2004, 51(6): 3679-3685. doi: 10.1109/TNS.2004.839245
    [3]
    李兴冀. 星用双极型器件带电粒子辐照效应及损伤机理[D]. 哈尔滨: 哈尔滨工业大学, 2010: 37-66.

    Li Xingji. Radiation effects and damage mechanisms caused by charged particles on bipolar devices used for space craft. Harbin: Harbin Institute of Technology, 2010: 37-66
    [4]
    刘超铭. 双极晶体管辐射损伤效应及深能级缺陷研究[D]. 哈尔滨: 哈尔滨工业大学, 2013: 98-135.

    Liu Chaoming. Radiation damage effects and deep level defects in bipolar junction transistor. Harbin: Harbin Institute of Technology, 2013: 98-135
    [5]
    Barnaby H J, Smith S K, Schrimpf R D, et al. Analytical model for proton radiation effects in bipolar devices[J]. IEEE Trans Nucl Sci, 2003, 49(6): 2643-2649.
    [6]
    Barnaby H J, Schrimpf R D, Sternberg A L, et al. Proton radiation response mechanisms in bipolar analog circuits[J]. IEEE Trans Nucl Sci, 2001, 48(6): 2074-2080. doi: 10.1109/23.983175
    [7]
    Li Xingji, Liu Chaoming, Rui Erming, et al. Simultaneous and sequential radiation effects on NPN transistors induced by protons and electrons[J]. IEEE Trans Nucl Sci, 2012, 59(3): 625-633. doi: 10.1109/TNS.2012.2191572
    [8]
    Li Xingji, Geng Hongbin, Liu Chaoming, et al. Combined radiation effects of protons and electrons on NPN transistors[J]. IEEE Trans Nucl Sci, 2010, 57(2): 831-836. doi: 10.1109/TNS.2009.2039355
    [9]
    Wang Chenhui, Bai Xiaoyan, Chen Wei, et al. Simulation of synergistic effects on lateral PNP bipolar transistors induced by neutron and gamma irradiation[J]. Nucl Instrum Meth A, 2015.
    [10]
    Song Yu, Zhang Ying, Liu Yang, et al. Mechanism of synergistic effects of neutron-and gamma-ray-radiated PNP bipolar transistors[J]. ACS Appl Electron Mater, 2019.
    [11]
    Sze S M, Kwok K N. Physics of semiconductor devices[M]. 3rd ed. New York: Wiley-Interscience, 2006.
    [12]
    叶迟凡. 晶体管电流放大系数β与集电极电流IC的关系[J]. 怀化师专学报(自然科学版), 1987(5):64-67. (Ye Chifan. The relationship between transistor current amplification factor beta and collector current IC[J]. Journal of Huaihua Teachers College (Natural Science Edition), 1987(5): 64-67
    [13]
    Claeys C, Simoen E. Radiation effects in advanced semiconductor materials and devices[M]. Springer-Berlin Heidelberg GmbH, 2002.
    [14]
    Kosier S L, Shrimpf R D, Nowlin R N, et al. Charge separation for bipolar transistors[J]. IEEE Trans Nucl Sci, 1993, 40(6): 1276-1285. doi: 10.1109/23.273541
    [15]
    Neamen D A. 半导体物理与器件[M]. 4版. 北京: 电子工业出版社, 2013.

    Neamen D A. Semiconductor physics and devices: basic principles [M]. 4th ed. Beijing: Publishing House of Electronics Industry, 2013
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