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金属材料内部缺陷精确工业CT测量方法

齐子诚 倪培君 姜伟 张维国 郭智敏

齐子诚, 倪培君, 姜伟, 等. 金属材料内部缺陷精确工业CT测量方法[J]. 强激光与粒子束, 2018, 30: 025102. doi: 10.11884/HPLPB201830.170304
引用本文: 齐子诚, 倪培君, 姜伟, 等. 金属材料内部缺陷精确工业CT测量方法[J]. 强激光与粒子束, 2018, 30: 025102. doi: 10.11884/HPLPB201830.170304
Qi Zicheng, Ni Peijun, Jiang Wei, et al. CT method for accurately sizing flaws in metallic material[J]. High Power Laser and Particle Beams, 2018, 30: 025102. doi: 10.11884/HPLPB201830.170304
Citation: Qi Zicheng, Ni Peijun, Jiang Wei, et al. CT method for accurately sizing flaws in metallic material[J]. High Power Laser and Particle Beams, 2018, 30: 025102. doi: 10.11884/HPLPB201830.170304

金属材料内部缺陷精确工业CT测量方法

doi: 10.11884/HPLPB201830.170304
基金项目: 

国家自然科学基金项目 61471411

浙江省自然科学基金项目 LQ15E010003

装备预研领域基金项目 61409230305

详细信息
    作者简介:

    齐子诚(1984-),男,副研究员,从事无损检测自动化技术、图像处理等方面的研究;nathan1984@qq.com

  • 中图分类号: TG115.28

CT method for accurately sizing flaws in metallic material

  • 摘要: 利用图像点扩散函数(PSF)近似计算法建立线阵探测器工业CT金属材料X射线衰减测量模型,并利用该测量模型对垂直于X射线平面边界灰度幅值进行数值计算,获得当前PSF曲线。在此基础上,建立基于近似PSF曲线的缺陷检测理论模型,并对缺陷进行定量检测分析。采用高能6 MeV工业CT线阵探测器系统,对含有人工缺陷的不锈钢试块进行缺陷检测试验。结果表明:相比于传统半高宽缺陷测量方法,本实验方法在缺陷定量检测精度上有较大提高,从而为提升金属材料内部缺陷的定量检测水平提供新的方法和技术途径。
  • 图  1  金属材料工业CT检测示意图

    Figure  1.  Inspection of metalic material by CT measurement

    图  2  垂直平面边界特征函数Rvertical曲线

    Figure  2.  Vertical plane boundary eigenfunction Rvertical

    图  3  斜平面边界特征函数Rslope曲线

    Figure  3.  Oblique plane boundary eigenfunction Rslope

    图  4  任意曲面边界特征曲线Rsurface曲线

    Figure  4.  Arbitrary surface boundary eigenfunction Rsurface

    图  5  缺陷单边定量反演流程图

    Figure  5.  Flow chart of defects' single-sided quantitative inversion flow chart

    图  6  高能工业CT检测系统

    Figure  6.  High-energy industrial CT detection system

    图  7  被检试样人工缺陷分布示意图(单位:mm)

    Figure  7.  Diagram of artificial defects distribution in stainless steel samples

    图  8  边缘响应函数和点扩散函数曲线

    Figure  8.  Edge response function (ERF) and (PSF) curves

    图  9  切片厚度0.5 mm下不同尺寸的缺陷真实值/测量值比较曲线

    Figure  9.  Comparison of defect sizes slice thickness is 0.5 mm

    图  10  不同切片厚度下缺陷直径测量值比较曲线

    Figure  10.  Comparison of defect diameters with different slice thickness

    图  11  缺陷灰度分布及反求曲线图

    Figure  11.  Defect gray distribution and inverse curve

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出版历程
  • 收稿日期:  2017-08-06
  • 修回日期:  2017-10-09
  • 刊出日期:  2018-02-15

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