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太赫兹金属器件电铸工艺中电流密度研究

赵欣悦 姬生伟 卢怡如 刘玉宝 黄波 王小康

赵欣悦, 姬生伟, 卢怡如, 等. 太赫兹金属器件电铸工艺中电流密度研究[J]. 强激光与粒子束, 2019, 31: 083102. doi: 10.11884/HPLPB201931.190067
引用本文: 赵欣悦, 姬生伟, 卢怡如, 等. 太赫兹金属器件电铸工艺中电流密度研究[J]. 强激光与粒子束, 2019, 31: 083102. doi: 10.11884/HPLPB201931.190067
Zhao Xinyue, Ji Shengwei, Lu Yiru, et al. Study of current density distribution in terahertz device micro-electroforming process[J]. High Power Laser and Particle Beams, 2019, 31: 083102. doi: 10.11884/HPLPB201931.190067
Citation: Zhao Xinyue, Ji Shengwei, Lu Yiru, et al. Study of current density distribution in terahertz device micro-electroforming process[J]. High Power Laser and Particle Beams, 2019, 31: 083102. doi: 10.11884/HPLPB201931.190067

太赫兹金属器件电铸工艺中电流密度研究

doi: 10.11884/HPLPB201931.190067
基金项目: 

国家自然科学基金项目 61501166

详细信息
    作者简介:

    赵欣悦(1994-), 女, 硕士研究生, 从事太赫兹器件的设计及加工研究, zhaoxinyue@mail.hfut.edu.cn

  • 中图分类号: TQ153.4

Study of current density distribution in terahertz device micro-electroforming process

  • 摘要: 微电铸工艺是太赫兹全金属光栅器件成型的关键工序。金属光栅质量取决于电铸工艺中金属离子沉积的均匀性, 而电铸槽阴极附近电流密度的分布直接影响金属离子沉积的均匀性。在阳极与阴极间添加开孔的绝缘玻璃挡板可以改善阴极电流密度分布的均匀性, 研究了挡板与阴极的距离以及挡板开孔大小对阴极电流密度分布的影响, 仿真结果表明: 添加开孔绝缘挡板有助于改善阴极处的电流密度分布; 当添加的玻璃挡板开孔大小与阴极尺寸一致时, 挡板距离阴极越近, 阴极的电流密度分布越均匀。根据仿真结果设计了相应的挡板, 电铸工艺获得了较好质量的均匀金属层, 从而验证了上述仿真分析的有效性。
  • 图  1  微电铸模型

    Figure  1.  Micro-electroforming model

    图  2  未使用玻璃挡板时阴极表面的电流密度分布

    Figure  2.  Current density distribution on the cathode surface without baffle panel

    图  3  使用玻璃挡板时阴极表面的电流密度分布

    Figure  3.  Current density distribution on the cathode surface with baffle panel

    图  4  挡板与阴极不同距离处阴极的电流密度分布

    Figure  4.  Current density distribution of the cathode at different distance between the baffle panel and the cathode

    图  5  不同开孔的玻璃挡板下阴极处电流密度分布

    Figure  5.  Current density distribution at the cathode with different hole in the baffle panel

    图  6  有无挡板时获得的电铸金属层的表面形貌

    Figure  6.  Surface profile of electroformed metal layer

    表  1  各材料的电导率

    Table  1.   Conductivity of each material in the system of electroforming

    material conductivity/(S·m-1)
    copper 5.8×107
    electroforming solution 170
    SU-8 resist 10-14
    baffle panel 10-14
    下载: 导出CSV
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出版历程
  • 收稿日期:  2019-03-08
  • 修回日期:  2019-04-21
  • 刊出日期:  2019-08-15

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