Experimental study on online cleanliness of the 400 mm aperture 4×2 combined slab amplifier
-
摘要: 在氙灯放电泵浦过程中, 片状放大器片腔内材料在高强度氙灯光辐照下, 存在显著的热解过程, 产生大量的μm级悬浮粒子。针对放大器在线洁净度控制,采取了包括选用有利于洁净控制的材料、消除盲孔与焊缝、深度酸洗刻蚀、高压喷淋清洗和最终的光照清洗等系列有效措施。实验研究结果表明:经过100发次光照清洗,片腔内气溶胶颗粒处于300~1000之间,接近美国国家点火装置(NIF)洁净水平;发次运行完成后,利用约0.4 m/s的氮氧混合气体对放大器腔体进行吹扫,气溶胶颗粒在2 min内可恢复至0值。Abstract: In the discharge pumping process of xenon lamp, there is a significant pyrolysis process of the materials in the cavity of the slab amplifier under the irradiation of high intensity xenon light, which produces a large number of micron sized suspended particles. For the online cleanliness control of the amplifier, a series of effective measures were taken, including the selection of materials conducive to the cleanliness control, elimination of blind holes and welds, deep pickling and etching, high-pressure spray cleaning and final light cleaning. The experimental results show that after 100 times of light cleaning, the aerosol particles in the chamber are between 300 and 1000, which is close to the cleanliness level of the American National Ignition Facility (NIF) Project; After the operation of the generator is completed, the amplifier chamber is purged with a mixture of nitrogen and oxygen of about 0.4 m/s, and the aerosol particles can recover to zero within 2 minutes.
-
Key words:
- slab amplifier /
- cleanliness /
- aerosol /
- optical surface damage
-
表 1 真片腔室与假片腔室状态对比
Table 1. Comparison of real slab chamber and false slab chamber
slab cavity status of slab surface cleaning process of slab status of partition glass real slab cavity There are 4 slabs in total, of which 1 is a real one (with edging treatment completed) and 3 are fake ones (without edging treatment). wiping and cleaning the surface of the real slab and ultrasonic cleaning the fake slabs The surface of partition glass is coated with a chemical film that can enhance the transmission of xenon light. fake slab cavity there are 4 fake slabs in total ultrasonic cleaning ordinary glass without chemical film -
[1] Spaeth M L, Manes K R, Bowers M, et al. National Ignition Facility laser system performance[J]. Fusion Science and Technology, 2016, 69(1): 366-394. doi: 10.13182/FST15-136 [2] Spaeth M L, Manes K R, Kalantar D H, et al. Description of the NIF laser[J]. Fusion Science and Technology, 2016, 69(1): 25-145. doi: 10.13182/FST15-144 [3] Haynam C A, Wegner P J, Auerbach J M, et al. National Ignition Facility laser performance status[J]. Applied Optics, 2007, 46(16): 3276-3303. doi: 10.1364/AO.46.003276 [4] Horvath J A. NIF/LMJ prototype amplifier mechanical design[R]. UCRL-JC-124520, 1996. [5] He X T, Zhang W Y. Inertial fusion research in China[J]. The European Physical Journal D, 2007, 44(2): 227-231. doi: 10.1140/epjd/e2007-00005-1 [6] Honig J. Cleanliness improvements of National Ignition Facility amplifiers as compared to previous large-scale lasers[J]. Optical Engineering, 2004, 43(12): 2904-2911. doi: 10.1117/1.1815320 [7] Honig J. Offline slab damage experiments comparing air and nitrogen purge[R]. NIF-0070328, 2001: 22-29. [8] Honig J, Ravizza D. Nova retrospective and possible implications for NIF[R]. NIF-0110227, 1999. [9] Spaeth M L, Manes K R, Honig J. Cleanliness for the NIF 1ω laser amplifiers[J]. Fusion Science and Technology, 2016, 69(1): 250-264. doi: 10.13182/FST14-861 [10] 於海武, 郑万国, 唐军, 等. 高功率激光放大器片腔洁净度实验研究[J]. 强激光与粒子束, 2001, 13(3):272-276Yu Haiwu, Zheng Wanguo, Tang Jun, et al. Investigation of slab cavity cleanliness of high power laser amplifiers[J]. High Power Laser and Particle Beams, 2001, 13(3): 272-276 [11] 程晓锋, 苗心向, 陈远斌, 等. 神光-III主机激光装置片状放大器洁净控制进展[J]. 强激光与粒子束, 2012, 24(1):1-2Cheng Xiaofeng, Miao Xinxiang, Chen Yuanbin, et al. Development on cleanliness control of slab amplifiers for Shenguang-III laser driver[J]. High Power Laser and Particle Beams, 2012, 24(1): 1-2 [12] 程晓锋, 王洪彬, 苗心向, 等. 高功率固体激光驱动器污染控制及片状放大器洁净度改进[J]. 强激光与粒子束, 2013, 25(5):1147-1151 doi: 10.3788/HPLPB20132505.1147Cheng Xiaofeng, Wang Hongbin, Miao Xinxiang, et al. Contamination control for high-power solid-state laser driver and improvement of cleanliness in slab amplifiers[J]. High Power Laser and Particle Beams, 2013, 25(5): 1147-1151 doi: 10.3788/HPLPB20132505.1147