Evaluation of reliability improvement effect on laser adaptive optics systems
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摘要: 随着自适应光学技术在激光领域的发展,工程上以经典自适应光学(AO)系统为基础,增加了多种基于软件监测和硬件保护的改进措施以保证激光AO系统稳定连续出光。面对结构复杂度提升带来的可靠性挑战,如何构建系统失效模型对激光AO系统可靠性进行评估,成为影响激光AO系统发展的重要一环。本文以激光光稳净化AO系统为例,提出使用动态故障树方法对激光AO系统可靠性进行评估,根据设备间动态关系建立动态故障树(DFT),结合厂家信息、疲劳寿命试验与历史数据估计得到底事件失效率,使用二元决策图和马尔可夫模型求解得到DFT的可靠性参数。使用DFT分析增加改进措施的AO系统可靠运行时间,结果相对于基本故障树获得了十倍以上的提高。实际系统调试期间,在预计的可靠运行时间内未发生自因故障,与DFT估计结果一致。验证了应用DFT方法评估增加改进措施后的激光AO系统可靠性更准确。Abstract: With the development of adaptive optics (AO) technology in laser field, a variety of improvement measures based on software monitoring and hardware protection have been added to the classical AO system to ensure stable and continuous light output of laser AO system. Facing the reliability challenge brought by the increase of structural complexity, how to build a system failure model to evaluate the reliability of laser AO system has become an important part of the development of laser AO system. In this paper, a dynamic fault tree (DFT) method is proposed to evaluate the reliability of laser AO system, and the dynamic fault tree is established according to the dynamic relationship between the equipment. The bottom event failure rate is estimated by combining the manufacturer information, fatigue life test and historical data. The reliability parameters of DFT are obtained by using binary decision graph and Markov model. Using DFT to analyse the reliable running time of the AO system with the improvement measures, the result shows more than ten times improvement relative to the basic fault tree. In the actual system joint commissioning, no self-induced failure occurred during the expected reliable running time, which is consistent with the DFT estimate. It is proved that the reliability evaluation of laser AO system with improvement measures is more accurate by using DFT method.
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Key words:
- adaptive optics /
- dynamic fault tree /
- reliability evaluation /
- Markov model
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表 1 AO系统基本故障树事件表
Table 1. AO system basic fault tree events table
event failure event meaning failure rate/h−1 event failure event meaning failure rate/h−1 T1 classical AO system failure X4 beam clean wavefront processing failure 2×10−5 M1 failure of wavefront control subsystem X5 beam stabilization high-voltage drive failure 1.5×10−5 M2 failure of monitoring and recording subsystem X6 beam clean high-voltage drive failure 1.5×10−5 M3 communication subsystem failure X7 beam stabilization tilt mirror failure 2×10−3 M4 power subsystem failure X8 beam clean deformable mirror failure 2×10−3 M5 wavefront detection module failure X9 monitoring control module failure 1×10−5 M6 wavefront processing module failure X10 failure of data recording module 1×10−5 M7 wavefront control module failure X11 main control network failure 1×10−5 M8 wavefront correction module failure X12 electric control network failure 1×10−5 X1 beam stabilization wavefront detection failure 1×10−5 X13 program control power supply failure 1×10−5 X2 beam clean wavefront detection failure 1×10−5 X14 total power failure 1×10−5 X3 beam stabilization wavefront processing failure 2×10−5 表 2 改进AO系统动态故障树新增事件表
Table 2. Added event table of improved AO system DFT
event failure event meaning failure rate/h−1 event failure event meaning failure rate/h−1 T2 AO system failure with reliability
improvement measuresM15 mirror monitoring and warning failure 1×10−2 M9 power supply module failure X15 UPS failure 2×10−3 M10 sensor detection failure X15 UPS spare failure 1×10−5 M11 high voltage protection failure X16 image slope effectiveness monitoring failure 1×10−2 M12 high pressure drive failure X17 voltage instability monitoring failure 1×10−2 M13 active mirror protection failure X18 hardware protection network failure 1.5×10−5 M14 active mirror failure X19 air knife failure 1.5×10−3 表 3 改进AO系统动态故障树事件重要度表
Table 3. Event importance table of improved AO system DFT
event Is Ip Ic X1 2-12 0.5797 0.0160 X2 2-12 0.5797 0.0160 X3 2-10 0.9070 0.0499 X4 2-10 0.9070 0.0499 X5 2-12 0.0014 5.9110×10−5 X6 2-12 0.0014 5.9110×10−5 X7 2-12 0.0335 0.1429 X8 2-12 0.0335 0.1429 X9 2-10 0.9046 0.0249 X10 2-10 0.9046 0.0249 X11 2-10 0.9046 0.0249 X12 2-10 0.9046 0.0249 X13 2-10 0.9046 0.0249 X14 2-11 0.0016 4.4057×10−5 X15 2-11 1.4412×10−6 6.1455×10−6 X15 2-11 0.0012 3.3525×10−5 X16 2-11 0.0072 0.0682 X17 2-12 2.2341×10−5 2.1297×10−4 X18 2-12 0.0029 1.1873×10−4 X19 2-12 0.2281 0.7762 M15 2-12 0.1511 1.4403 表 4 光稳净化系统试验记录
Table 4. Test record of beam stabilization and clean system
time for one
experiment/stimes during
experiments/timetotal time/
(s·time)0.5 24 184 1 22 2 1 3 6 5 5 10 3 15 1 30 2 -
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