Abstract: A sequential test method based on Bayesian posterior probability was proposed to perform tests of hypotheses about probability of success of binomial distribution in complicated hypothesis conditions. The decision rules were constructed and the method for calculating the criterion value was given. For a given maximal sample size, the truncated method of judge criteria for hypothesis test was discussed. An experimental program was given to test the hypotheses about the probability of failure of device affected by microwave using the proposed method. At last, an example was presented to illustrate the proposed method and the result is compared with that of the existing methods.