Error in stitching testing for large aperture continuous phase plate
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摘要: 对大口径连续相位板(CPP)在子孔径拼接检测过程中存在的几种影响检测精度的主要因素, 包括定位误差、系统误差和拼接模式等进行了归纳并分析了其对检测精度的影响权重。通过对子孔径重叠区域分布的均匀性计算,分析了检测误差对拼接质量的影响。结果表明,定位误差是影响CPP拼接精度的主要原因,而对系统误差进行有效处理可以进一步减小重叠区非均匀性,拼接模式的选择对CPP的拼接结果的影响有限。通过CPP深度特性对重叠区域均匀性的统计分析表明,在像素级别的检测中,重叠区域均方根残差随着CPP深度的增加而线性增加,即拼接精度随CPP深度的增加而降低。Abstract: By calculating the nonuniformity in overlapping area between sub-apertures, errors such as positioning error, system error and stitching model pattern that affect the stitching testing prelision of large aperture continuous phase plate(CPP) are summarized and analyzed. Some results indicate that positioning errors are the major reason affecting the stitching precision and the nonuniformity in overlapping area could be decreased as the system errors are handled effectively. Furthermore, there is no more obvious difference in the choice of stitching pattern concerning the stitching result. The statistical result shows that the root-mean-square of the residual error(ERMS) raises in the overlapping area as the increment of depth as CPP's wavefront at the testing level of pixel, which means that the stitching testing precision declines simultaneously.
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Key words:
- continuous phase plate /
- wavefront testing /
- sub-aperture stitching
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