腔内倍频法测量KDP类晶体损耗系数
-
摘要: 用腔内倍频方法测量无源腔内晶体吸收和散射共同作用带来的损耗，其特点是响应时间很短，约100ns，并具有很高的灵敏度（约10-4）,可望应用于高功率激光照射下非线性光学晶体无损损伤以及快速损伤的研究。将测量KDP类晶体的损耗结果与文献资料作了比较。Abstract: A special designation is reported to measure the loss together of absorption and deflection in NLO crystals in the cavity. The method has characters of high sensitivity to about 10 －4 and fast response time up to 100 nanoseconds. We consider it extensible to be applied in the studies of nondestructive and quick destructive detection of NLO crystals related to the irradiation of high peek power laser. The results of KTP、KDP、KD*P crystals in our experiment and also the comparison to others is shown.
-
Key words:
- loss measurement /
- harmonic generation /
- kdp crystals
-
点击查看大图
计量
- 文章访问数: 2419
- HTML全文浏览量: 273
- PDF下载量: 658
- 被引次数: 0
下载:
