场致发射阳极用钨网的寿命特性分析
Lifecharacteristic analysis of anode tungstenmesh in a coldcathode diode
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摘要: 通过扫描电镜分析和实验验证,分析了场致发射阳极用钨网被破坏的成因。对钨网进行淬火处理,使钨网表面形成一定厚度的氧化膜,可显著提高钨网使用寿命。不同的淬火温度,将使钨网表面形成不同厚度的氧化膜。实验结果表明,氧化膜厚度的改变,将明显影响钨网的使用寿命。当脉宽90ns、束流6kA、能量1MeV的电子束透过钨网时,钨网表面的氧化膜厚度选在0.4μm左右为宜。Abstract: The damage reason of an anode tungstenmesh is analyzed by scanning electron mirror and experiments. When a tungstenmesh is quenchtreated, an oxidizedlayer forms on its surface and the life of the tungstenmesh increases obviously. Auger effect spectrum of tungstenmesh samples shows that the thickness of the oxidizedlayer changes with quenchtreated temperature. The experimental results show that the thickness of the oxidizedlayer obviously affects the life of tungstenmesh. The optimum thickness of the oxidizedlayer is about 400nm when a 90ns(FWHM), 6kA, 1MeV beam passes through the tungstenmesh.
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Key words:
- tungstenmesh /
- quenchtreatment /
- oxidizedlayer
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