500 fs超短脉冲激光对CCD探测器的破坏效应
Damage effect on CCD detector irradiated by 500 fs laser pulse
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摘要: 采用脉宽500 fs，脉冲能量250 μJ的超短脉冲激光辐照线阵CCD探测器，观察到了CCD从线性响应到像元饱和、饱和串音直至硬损伤的整个过程，并着重对两种辐照能量密度下的硬损伤机理进行了理论分析。结果表明：激光能量密度为0.45 μJ/cm2时，达到像元饱和；能量密度为0.14 J/cm2时，辐照6个脉冲后实现了CCD器件的硬损伤，硬损伤源于晶格被加热并汽化形成等离子体；能量密度为1.41 J/cm2时，单个脉冲就使CCD器件的输出波形无法辨认，2个脉冲后CCD器件没有任何信号输出，硬破坏源于电荷分离形成的电场库仑力。Abstract: A 250 μJ, 500 fs ultra-short laser pulse was used to radiate linear array CCD detector. The whole responding from linear, saturation, cross talk and totally damaged was observed. Theoretical analyses were made to explain the damage mechanism. The experiment shows that the saturated energy threshold of CCD element is 0.45 μJ/cm2. The CCD is damaged by six pulses with energy density of 0.14 J/cm2 and the damage is due to lattice heat and evaporation with plasma. When the laser energy density is 1.41 J/cm2, the output waveform of CCD detector is unrecognizable for single pulse and there is no output for two pulses. The damage mechanism is considered to be Coulomb force of electric field from charge separation.
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Key words:
- ccd detector /
- ultra-short pulse laser /
- damaging mechanism /
- element saturation /
- cross talk
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