Al-X谱线电子碰撞展宽的理论研究
Theoretical calculations of electron impact broadening o f Al X lines
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摘要: 使用R-矩阵方法和半经验方法，计算了高价离子Al-X 2s2 1S-2s2p1P0共振谱线在电子密度为1017cm-3时的线宽和线移随温度的变化关系，两种计算得到的线宽结果符合得比较好。使用半经验方法可以获得大量谱线的电子碰撞展宽，以满足需要大量数据的等离子体不透明度的计算的需要。使用半经验方法同时得到了其它一些谱线的电子碰撞宽度。Abstract: The width and shift of the Al X resonance line 2s2 1S-2s2p1P0 were calculated using R-matrix method and semi-empirical method. Good agreement was found between the two calculations. The semi-empirical method can easily obtain large numbers of widths and there fore can be applied to derive the opacity of plasmas using detailed-term-accounting-approximation calculations. Some other widths of Al X lines were also obtained using the semi-empirical method. Detailed-term-accounting model can obtain accurate opacities of high temperature plasmas, but it requires large number s of atomic parameters such as excitation energies, oscillator strengths and widths of dipole allowed transitions. The results presented in this paper show that the calculations of the electron impact broadening can be greatl
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Key words:
- r-matrix /
- semi-empirical method /
- al x ion /
- electron impact broadening
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