X射线法测量ICF靶丸参数中表面轮廓法的应用
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摘要: 在ICF靶参数测量中，用接触X射线显微辐射照相法记录微球X射线图像，采用精密表面轮廓仪处理微球X射线图像，直接测量了单层微球壁厚。与光干涉法比较，两种方法测量结果相差小于0.3μm。Abstract: The X-ray radiography technique for measurement of ICF targets. Record film images of microspheres using contact microradiography. Analysis the X-ray images using surface profiler, direct measuring the wall thickness of single-wall microsphere. Comparsed this measurement with the optical interferometric measurement and found measurement differences <0.3μm.
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Key words:
- x-ray radiography technique /
- icf target /
- surface profil
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