喷气Z箍缩X光辐射信号分析
X-ray radiation of neon gas puff Z-pinch
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摘要: 在清华大学喷气Z箍缩平台上进行了对Ne气的箍缩软X射线诊断工作。该喷气装置由4个充电至23 kV的电容器并联组成，总储能4.5 kJ，放电电流峰值210 kA，上升沿2.5 ms。实验中通过观测放电电流微分信号来观测箍缩聚焦点的位置（波形的下凹尖峰点），此尖峰也是X光辐射的时间分辨点。利用响应时间为亚ns量级的光敏半导体探测器(PIN)探头获得了Ne气箍缩时等离子体发出的软X射线信号，X光辐射出现在放电电流微分信号突变点附近。一般来说，多次箍缩会导致多次的X光辐射输出，实验中的X光脉冲实际为多个等离子热点辐射叠加的结果，单次箍缩所产生的X光辐射比多次箍缩所产生的X光辐射要强。对每次箍缩来说，单个X光脉冲信号比多个X光脉冲信号的幅值要大。Abstract: X-ray radiation produced by a small gas puff Z-pinch device in Tsinghua University was detected. This device was powered by a 16 mF capacitor bank charged to 230 kV, corresponding to a storage energy of 4.3 kJ, the discharge current reached its peak value of 210 kA at a time of 2.5 ms. The X-ray radiation from a Neon gas puff Z-pinch was measured with a sub-ns rise time PIN detector. The differential signal of discharge current was recorded to determine the pinch point, when the X-ray radiation was emitted. The signals were analyzed and discussed in this paper.
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Key words:
- gas puff z-pinch /
- x-ray /
- pin
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