X射线不同方向辐照80C196KC20单片机研究
80C196KC20 microprocessor irradiated by X-ray in different directions
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摘要: 为明确X射线不同方向入射对器件的影响，利用中国测试技术研究院的直流SJ-A X光机产生的X射线，从与垂直80C196KC20单片机表面不同方向角度对单片机进行辐照试验。试验结果显示，随着辐照角度由0°增加到90°，单片机所受的影响逐渐减小，90°时最不明显，表明此种单片机外壳在对其X射线总剂量效应的影响最大，原因在于X射线在不同方向照射时，需要穿过不同厚度的封套材料，X射线在此过程受到的衰减不同。
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关键词:
- X射线辐照 /
- 80C196KC20单片机 /
- 总剂量效应 /
- 衰减
Abstract: X-ray is produced by SJ-A X-ray tube in China Academy of Measurement and Test Technology, Chengdu,and 80C196KC20 microprocessor is irradiated by X-ray in different directions. The direction is defined along the line which is perpenticular to the surface of the microprocessor. The results of the test show that the effect of X-ray to the microprocessor decreases while the angle changes from 0° to 90°. The main reason is that X-ray may go through different thickness of the crust of device when the device is irradiated in different directions.-
Key words:
- x-ray irradiation /
- 80c196kc20 microprocessor /
- total ionization effect /
- decline
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