激光装置片状放大器组件的氙灯可靠性分析
Reliability analysis of Xe-flashlamps of disk amplifier subsystems for laser facility
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摘要: 整理惯性约束聚变激光装置的运行记录和氙灯的故障数据,得到10种氙灯故障现象,并且归纳为3类,即触发故障、绝缘故障和氙灯爆炸,按故障发生时间可以分为“引发失效”的故障和“舍生取义”的故障。分析3类氙灯故障与片状放大器组件以及装置打靶成功率的逻辑关系,生成基于氙灯故障的装置打靶故障树,描述氙灯可靠性对于装置打靶成功的重要性。分析氙灯的生产工艺流程和工艺缺陷,生成氙灯的故障与工艺的鱼刺图,揭示氙灯故障的根源。Abstract: Based on the facility experimental records and the flashlamp fault data, ten phenomena of faults are found and they are classified into three categories, trigger failures, electrical insulation failures, and flashlamp explosions. Two distinct kinds of faults are found by further analysis, one leading to the flashlamp failures and the other leading to no flashlamp failures. A flashlamps fault tree is obtained for the shot reliability by analyzing logic relationships among the three categories of faults, disk amplifier subsystems, and the shot reliability, which illustrates the importance of the flashlamp reliability to the shot reliability. Finally, a causeeffect diagram for the faults and techniques indicating diverse causes of the flashlamp fault is presented by analyzing the flashlamp
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Key words:
- disk amplifier subsystems /
- reliability /
- xe-flashlamps /
- fault tree /
- cause effect diagram
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