X光背光观测烧蚀面扰动引起内界面扰动的增长
Observation of growth of rear surface perturbation caused by ablation surface
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摘要: 侧向背光照相能直接反映靶表面扰动幅度的变化情况。在神光Ⅱ装置上，实验利用侧向背光照相技术，对烧蚀面扰动引起的内界面扰动增长进行了观测。实验结果表明，观察到的内界面扰动幅度大于期望值。分析认为，造成内界面较大扰动增长的原因主要是2维效应。X光辐照的主要是烧蚀面的中间部分，烧蚀面扰动引起的内界面的扰动就呈现出一幅从中间的扰动区域逐渐过渡到四周的图像。由此，提出了新的靶优化设计方案，应尽可能减小沿背光方向的样品尺寸。Abstract: Sideon radiography technology can directly demonstrate the change of perturbation amplitude on target surface. In the experiment at Shenguang Ⅱ laser facility, this technology is used to detect rear surface perturbation caused by the ablation surface perturbation. The perturbation amplitude observed in the experiment is higher than expected. According to our analysis, twodimension effect is the main reason for larger perturbation growth of the rear surface. Because X ray mainly irradiates the center of the ablation surface, the rear surface perturbation, which is caused by the ablation surface perturbation, exists in the center and gradually spreads around. Based on above discussion, an optimized target design is presented at last, which suggests the target size along the direction of
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Key words:
- hydrodynamic instability /
- ablation surface /
- sideon radiography /
- twodimension effect
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