平面镜反射率的标定及修正
Calibration and correction of reflectivity of soft X-ray planar mirror
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摘要: 研究了用同步辐射源标定软X光掠入射平面镜的反射率。实验采用北京同步辐射装置(BSRF)-3W1B束线及反射率计靶室，在50~1 500 eV能区，做了C，Si，Ni和Au材料平面镜在1°~7°掠射角下的反射率标定曲线。由于3W1B束线的单色器采用变间距光栅作色散元件，光栅分光必然存在高次谐波，高次谐波严重影响光源的单色性，从而给平面镜的反射率标定值带来误差。前置滤片虽然能有效抵制高次谐波，但不能完全消除高次谐波。为此，利用透射光栅对光源做了单色性研究，给出高次谐波在不同能区所占光源强度的比例，从而对平面镜反射率标定值做出修正。Abstract: The reflectivity calibration and correction of soft X-ray planar mirror is studied. Research is done on the 3W1B beamline of Beijing synchrotron radiation facility for mirrors with several materials, from 50 eV to 1 500 eV, with 40～120 mA beam current and 2 GeV storage ring electron energy. Variable-spacing planar grating on 3W1B generates higher harmonics necessarily, which reduces monochromaticity notably and brings about some errors. Though prefilter is used, limited by the grating dispersion effeciency and X-ray source internsity, there are still some higher harmonics during 300～750 eV. Therefore, the calibrated reflectivity must be corrected.
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Key words:
- synchrotron radiation /
- soft x-ray /
- planar mirror /
- reflectivity calibration /
- correction
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