薄铝埋点等离子体K线光谱半定量实验测量
Quasi-quantitative experimental measurement of K-shell X-ray line spectrum from thin aluminum-dot target
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摘要: 提出了一种薄埋点靶：直径为200 mm、厚度为0.1 mm的铝点埋在20 mm厚的CH膜底衬中，表面再覆盖0.1 mm厚的CH膜。在星光Ⅱ激光装置上利用束匀滑激光打该埋点靶，在靶前向采用胶片记录的晶体谱仪测量铝离子K线谱，获得了铝离子K线谱半定量实验结果。并开展了非平衡铝等离子体发射光谱的理论计算分析。研究结果表明：采用单一等离子体状态且不考虑自吸收效应模拟计算获得的理论谱与实验谱符合较好，通过激光打薄埋点靶能够产生均匀的用于研究离化动力学和原子结构计算理论的光性薄高温等离子体。Abstract: A thin aluminum-dot target was presented to avoid gradients in temperature and density and self-absorption of the lines. The target is a film consisting of 20 mm thick CH substrate and 0.1 mm thick aluminum dot with diameter of 200 mm covered by 0.1 mm thick CH on the dot surface. The quasi-quantitative X-ray spectrum has been derived from the film recording signal by correcting the film response, filter absorption and the diagnostic geometry of the spectrometer and neglecting X-ray wavelength dependence of the crystal diffraction efficiency due to relatively small wavelength range. A non-local thermodynamic equilibrium spectral code was applied to simulate the measured aluminum spectrum. Good agreement between the measurement and the simulation was obtained through direct comparison and n
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