高重复频率飞秒激光对面阵CCD的干扰和破坏

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高重复频率飞秒激光对面阵CCD的干扰和破坏

郭少锋, 程湘爱, 傅喜泉, 孙运强, 王飞, 李文煜, 周玉平, 陆启生, 文双春

文章导航 > 强激光与粒子束 > 2007 > 19(11): 0-

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郭少锋, 程湘爱, 傅喜泉, 等. 高重复频率飞秒激光对面阵CCD的干扰和破坏[J]. 强激光与粒子束, 2007, 19(11).

引用本文:

郭少锋, 程湘爱, 傅喜泉, 等. 高重复频率飞秒激光对面阵CCD的干扰和破坏[J]. 强激光与粒子束, 2007, 19(11).

guo shao-feng, cheng xiang-ai, fu xi-quan, et al. Failure of array CCD irradiated by high-repetitive femto-second laser[J]. High Power Laser and Particle Beams, 2007, 19.

Citation:

guo shao-feng, cheng xiang-ai, fu xi-quan, et al. Failure of array CCD irradiated by high-repetitive femto-second laser[J]. High Power Laser and Particle Beams, 2007, 19.

郭少锋, 程湘爱, 傅喜泉, 等. 高重复频率飞秒激光对面阵CCD的干扰和破坏[J]. 强激光与粒子束, 2007, 19(11).

引用本文:

郭少锋, 程湘爱, 傅喜泉, 等. 高重复频率飞秒激光对面阵CCD的干扰和破坏[J]. 强激光与粒子束, 2007, 19(11).

guo shao-feng, cheng xiang-ai, fu xi-quan, et al. Failure of array CCD irradiated by high-repetitive femto-second laser[J]. High Power Laser and Particle Beams, 2007, 19.

Citation:

guo shao-feng, cheng xiang-ai, fu xi-quan, et al. Failure of array CCD irradiated by high-repetitive femto-second laser[J]. High Power Laser and Particle Beams, 2007, 19.

高重复频率飞秒激光对面阵CCD的干扰和破坏

1.
国防科学技术大学光电科学与工程学院, 长沙 41 0073;
2.
湖南大学计算机与通信学院, 长沙 41 0073

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出版历程
- 刊出日期: 2007-11-15

Failure of array CCD irradiated by high-repetitive femto-second laser

1.
College of Opto-Electric Science and Engineering,National University of Defense Technology,Changsha 410073,China;
2.
College of Computer and Communication,Hunan University,Changsha 410073,China

摘要: 采用800 nm，100 fs的超短脉冲激光器对硅面阵CCD进行辐照实验，观测到饱和、串扰以及永久性损伤等多种可能造成成像器件失效的现象，特别是在激光能量较高时，发现CCD在成像时出现了黑白屏的现象。在飞秒激光器以1，10和1 000 Hz工作的条件下，分别测量了硅面阵CCD的饱和阈值、串扰阈值和破坏阈值。对破坏后的CCD器件进行了显微分析。在1 kHz工作的条件下进行了视场外干扰实验，观察到串扰和全屏饱和的现象。
- 飞秒激光 /
- 面阵CCD /
- 破坏机理 /
- 串扰 /
- 饱和
Abstract: Silicon-CCD is irradiated by 800 nm 100 fs pulsed laser, and the phenomena of saturation, cross-talk and totally damage are observed and corresponding thresholds versus repetitive frequency are measured. Particularly, a new damage phenomenon characterized by a degraded image divided into a bright part and a dark part is observed. Microscope is used to analyze the damage mechanism and it is inferred that the most severe failure could result from the malfunction of CCD circuits because of laser irradiation. Typical results of CCD irradiated by laser out of field of view is also presented.
- femto-second laser /
- array ccd /
- damage mechanism /
- cross-talk /
- saturation

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