长导通等离子体开关断路过程的粒子模拟
Particle simulation of opening process in long conduction time plasma opening switch
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摘要: 利用PIC(particle-in-cell) 粒子模拟方法对长导通等离子体断路开关的断路过程进行了模拟研究。介绍了计算模型的建立和边界的处理。模拟结果揭示了断路间隙的形成过程和机制，并据此对等离子体断路开关断路阶段的现有模型进行了定性的修正，认为断路过程中Hall融蚀和静电融蚀机制将同时存在，静电融蚀在开关最终的断路中占主导作用，且静电融蚀是由于磁场排斥引起的。Abstract: The opening process of long conduction time plasma opening switch has been studied by particle-in-cell simulation. The building of computing model and complex boundaries is introducedin detail. Simulation results reveal the opening gap formation process and its mechanism. It is shown that both Hall erosion and electrostatic erosion affect the gap formation process, however, the latter is introduced by the magnetic field expulsion and dominates the opening stage eventually.
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