微通道板2.0～5.5 keV X射线透过率标定
Calibration of 2~5.5 keV X-ray transmissivity of microchannel plate
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摘要: 在北京同步辐射3B3中能X射线束线2.0~5.5 keV能段对微通道板(MCP)透过率进行了测量标定。实验表明，MCP在2.0 keV的低能段处和5.5 keV的高能段处的透过率较高，而中段较低。对MCP透射和X光在MCP毛细导管列阵中的全反射两种机制进行了物理建模，分别计算验证。结果发现:X光在毛细导管内掠入射会产生全反射，且能段越低反射率越高;MCP透过率特性正是MCP特殊的结构和材料造成的，为透射和反射两种机制共同贡献的结果，低能端主要来自X光在毛细导管中的全反射贡献，高能端主要来自透射贡献。Abstract: MCP transmissivity is calibrated on the 3B3 medium energy X-ray beamline in BSRF from 2.0~5.5 keV. The experimental result unveils that the transmissivity shrinks steeply from 2.0~3.5 keV, and reaches the bottom from 3.5~4.5 keV,then swells from 4.5~5.5 keV. MCP transmissivity near the two ends of low-energy 2 keV and high-energy 5.5 keV is higher than that at the middle part. Reflection and transmission are calculated in the pores array of MCP respectively. The grazing incident X-ray in pores results in total reflection, and the reflectivity rises as the X-ray energy falls, which successfully explains the peculiar phenomena of high transmissivity in low energy. Characteristic of MCP transmissivity is resulted from peculiar structure and material of the MCP, and is contributed together by
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Key words:
- microchannel plate(mcp) /
- x-ray /
- transmissivity /
- synchrotron radiation /
- calibration
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