靶丸表面缺陷对功率谱影响的数值模拟
Simulation of defects on micro-shells surface affecting power spectrum
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摘要: 对ICF靶丸表面“颗粒状”缺陷与功率谱的关系进行了理论研究，采用Matlab软件，数值模拟分析了靶丸表面颗粒的高度、粒径、分布、颗粒数目以及随机噪声等对功率谱曲线的影响。数值模拟结果表明：靶丸表面缺陷对功率谱影响较大，缺陷高度的增加、粒径的减小以及数目的增加都会导致功率谱起伏增大；同时，缺陷高度导致的功率谱起伏变化比缺陷粒径对功率谱的影响更为严重，而缺陷数目的增加不但导致功率谱起伏的增大，同时也引起功率谱曲线中呈现一些周期性的特征。Abstract: In ICF experiment, the defects on micro-shells surface will affect the capsule implosion hydrodynamic instabitiy seriously. The relationship between the defects on micro-shell surface and power spectrum was analyzed theoretically and simulated. The results show that the root mean square roughness(RMS) of power spectrum increased with the increases of height and the rand noise, and decreased with the decrease of daimeter of defects. At the same time, the effect of defect’s height on power spectrum was more serious than that of defect’s diameter. And the RMS of power spectrum increased with the increase of defect’s quantity, and resulted in some periodic characteristic in power spectrum curve.
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Key words:
- icf /
- micro-shell /
- defect /
- power spectrum /
- mode number
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