随机耦合模型在高功率微波效应中的应用
Application of random coupling model to high power microwave effects
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摘要: 分析了微波混沌腔体系统中关键部位感应电压的统计问题，介绍了随机耦合模型在高功率微波效应研究中的计算方法和应用，并以计算机机箱为实验系统，开展了电磁波耦合入计算机机箱腔体的电磁干扰问题研究，对其电路板上关键部位感应电压的统计计算和实验结果进行了比较，其结果基本一致。随机耦合模型在波混沌系统中感应电压的统计探讨为高功率微波效应、电磁兼容等研究提供了一种新的思路。Abstract: The statistical nature(probability density function) of the induced voltages at key points within the wave-chaotic scattering cavity was discussed. The applications of random coupling model(RCM) in the high power microwave(HPM) effects and electromagnetic compatibility were introduced. The practicability of RCM-based calculation has been validated by measuring the magnitudes of induced voltages at key points within the computer cavity. It shows that the calculated and experimental results are basically the same, offering a new method for electromagnetic compatibility and HPM effects research.
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