Abstract: The technique and system integration of imaging system to diagnose annular electron beam were introduced. The system is constructed basing on the principle and technology of digital flash X-ray intensifying screen. The principle is that the X-rays are emitted when the target material is bombarded by the high energy annular electron beam, the scintillator is irradiated by the X-ray outputs visible light. which is recorded by digital imaging system. In order to achieve necessary system sensitivity and spatial resolution, the target material and the maximum target thickness were ascertained by theoretic computing. The measure ment systems for field test fielded were designed, and its performance is well suited to testing application. The annular electron beam image was acquired, which shows