252Cf源和重离子加速器对FPGA的单粒子效应
Single event effects on FPGA of californium-252 and heavy-ion accelerator
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摘要: 对10万门基于静态随机存储器的现场可编程门阵列（FPGA）分别在锎-252（252Cf）源和HI-13串列加速器下进行了单粒子效应试验研究，测试了静态单粒子翻转截面及发生单粒子闩锁的线性能量转移阈值，并对试验结果进行了等效性分析比较。试验结果表明252Cf源引起的FPGA单粒子翻转截面比重离子加速器引起的约低1个数量级；使用252Cf源未能观测到该器件的单粒子闩锁现象，而使用重离子加速器可以测出该FPGA发生单粒子闩锁的线性能量转移阈值；在现代集成电路的宇航辐射效应地面模拟单粒子效应试验中252Cf源不是理想的测试单粒子闩锁的辐射源。Abstract: Single event effects (SEEs) test results on a static random access memory (SRAM)-based FPGA with 100 k system gates using californium-252 (252Cf) and the HI-13 tandem-accelerator are presented. The results including the static single event upset (SEU) cross-sections and the linear energy transfer (LET) threshold of single event latchup (SEL) were quantitatively compared and analyzed. The results showed that the SEU cross-sections using 252Cf were an order of magnitude less than the ones using the accelerator. SEL was not observed when the FPGA was exposed to the 252Cf, while SEL LET threshold could be measured when using the heavy-ion accelerator. Therefore, 252Cf is not an ideal radioactive source to test SEL of CMOS circuits fabricated with advanced technologies for experimental simulati
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