神光-Ⅱ激光装置上的针孔点背光成像技术实验研究
Experimental research on pinhole-assisted point-projection backlighting on Shenguang-Ⅱ laser facility
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摘要: 在神光-Ⅱ激光器上开展了针孔点背光成像技术实验研究，利用第9路激光驱动平面钛靶获得4.75 keV的准单能光源，在10 μm的针孔约束下形成次级点光源对镍网格等样品成像。实验获取了清晰的网格图像，空间分辨力达到7 μm，并对烧蚀碎片、杂散光等该技术的关键性问题进行了系统深入的研究分析。实验结果表明：针孔点背光具有高空间分辨力、大视场等特点，优于传统背光技术。Abstract: The research on pinhole-assisted point-projection backlighting has been performed on Shanghai Shenguang-Ⅱ laser facility. The point-like X-ray source at 4.75 keV was produced from 200 J/200 ps/351 nm backlighting laser interaction with 10 μm thick Ti target. And the clear gridding image with a spatial resolution of 7 μm was obtained. Key issues in improving signal-to-noise ratio and preventing blasting debris were analyzed. The pinhole-assisted point-projection backlighting shows advantages over traditional backlighting techniques, such as high spatial resolution, large view field.
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Key words:
- blasting debris /
- stray light /
- pinhole-assisted point-projection backlighting /
- icf
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