X射线CCD标定及模拟

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Calibration and modeling of X-ray CCD

1.
Research Center of Laser Fusion,CAEP,P.O.Box 919-986,Mianyang 621900,China;
2.
National Key Laboratory of High Temperature and Density Plasmas,CAEP,Mianyang 621900,China;
3.
Institute of High Energy Physics,Chinese Academy of Sciences,Beijing 100049,China

摘要: 在北京同步辐射光源4B7B实验站上，采用透射光栅配X射线电荷耦合元件(CCD)的方法对单色光进行了检验，在优化高次谐波抑制方法后，开展了X射线CCD的灵敏度标定实验研究；在标定数据处理过程中，提出了等效曝光时间的概念，修正了快门开合造成的曝光时间误差。标定实验获得了100~1 500 eV能区CCD的灵敏度，补充了300~600 eV能区CCD灵敏度标定数据，验证了简化模型的正确性。
- X射线电荷耦合元件 /
- 灵敏度 /
- 标定 /
- 机械快门 /
- 等效曝光时间
Abstract: An X-ray charge coupled device(CCD) was calibrated on the beamline 4B7B at Beijing Synchrotron Radiation Facility after the optimization of suppressing methods for high-order harmonics. In the process of data analysis, equivalent exposure time was introduced to correct the exposure time. Then the sensitivities of the CCD in the energy range between 100 and 1 500 eV were obtained. The calibration experiment fills the data gap of the sensitivity of the CCD in the energy range between 300 and 600 eV and validates the modeling in this energy range.
- x-ray charge coupled device /
- sensitivity /
- calibration /
- mechanical shutter /
- equivalent exposure time

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