线吸收系数能谱效应解析法研究
Research on spectrum effect on attenuation coefficient with analytical method
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摘要: 用数值模拟的方法研究了FTO客体材料的线吸收系数随着穿透材料深度的变化关系，并拟合出材料有效线吸收系数与厚度之间的函数表达式。研究结果表明，在闪光照相中X光能谱发生了硬化，并随着穿透材料深度的增加谱平均线吸收系数会随之减小。FTO客体中钨的平均有效线吸收系数0.838（4.53%）cm-1，铜的平均有效线吸收系数0.297（4.96%）cm-1，能谱效应对有效线吸收系数的影响小于5%。在图像重建中利用上述的线吸收系数能够反演出精度达5%的材料密度。Abstract: The relation between the line attenuation coefficient and the material thickness of FTO has been studied, and the function between them has been given. The results show that the efficient linear attenuation coefficient decreases when the thickness of material increases in the transmission direction of Xray. Specially，the average efficient attenuation coefficient in the FTO is 0.838cm－1 for tungsten with precision of 4.5% and 0.297cm－1 for copper with precision of 5.0%. The spectrum effect on attenuation coefficient is less than 5%. The material densities can be reconstructed with such precision.
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