Ionization beam profile monitor design for tandem accelerator
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摘要: 基于GIC4117串列加速器束流引出线束流测量需求,开展了电离型束流截面探测器设计工作,主要包括系统收集信号强度的计算,采用有限元软件进行电场系统、磁场系统优化设计,给出了电场系统与磁场系统设计参数。通过引入辅助磁场,测量系统能够实现束流轨道的自动校正,系统对束流的影响可以忽略。对影响测量精度的电离电子横向位置偏移进行了分析,并对电离电子进行轨迹跟踪。跟踪结果表明:电离电子在横向位置的运动偏移可以控制在0.3 mm以内,与理论分析一致。
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关键词:
- 串列加速器 /
- 电离性束流截面探测器 /
- 磁场设计 /
- 轨道跟踪
Abstract: The ionization beam profile monitor(IPM) was designed for the beamline of GIC4117 tandem accelerator. The key aspects of the design, such as the calculation of collecting signal intensity, design and optimization of the electric and magnetic field system using a 3-D finite element program are described. The incorporation of an auxiliary magnetic field makes it possible for the IPM to correct the beam orbit automatically. The transverse motion of the ionized electrons is critical to the accuracy of the beam profile measurement. Both theoretical analysis and tracking results of the transverse motion of ionized electrons were done based on the optimized field. The orbit tracking results show that the transverse motion deviation is less than 0.3 mm, which agrees well with the theoretical analysis results.
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