Exploratory research on off-line diagnosis method of ion beam profile
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摘要: 提出了一种基于二次离子质谱分析技术的离子束流剖面分布的离线诊断方法，具有分辨率高、可同时给出束流剖面分布和成分信息的特点。利用数值模拟方法对该诊断方法的可行性进行了分析和讨论，并结合原理实验给出了验证结果。结果表明：该方法可以用于真空密封型中子发生器离子束流剖面分布的诊断，能够成为其他诊断方法的验证手段和有力补充。
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关键词:
- 真空密封型中子发生器 /
- 真空弧离子源 /
- 束流剖面 /
- 二次离子质谱分析
Abstract: A novel off-line diagnosis method for ion beams of the sealed tube neutron generator is introduced, which is based on secondary ion mass spectrometry (SIMS). The method has high resolution and can provide intensity distribution of ion beam profile and ion composition. The feasibility of the method was analyzed and discussed by numerical simulation, and verified by experiment. The preliminary experimental results indicate the hydrogen distribution and titanium distribution. This method can be used to diagnose the ion beam profile for the sealed tube neutron generator, and can provide confirmation and complement for other diagnostic methods. -
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