计算机机箱关键部位感应电压统计特性分析

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Analysis of statistical nature of induced voltages at key points in computer box cavity in different frequency ranges

1.
Complicated Electromagnetic Environment Laboratory of CAEP,Mianyang 621900,China;
2.
Science and Technology on High Power Microwave Laboratory,Institute of Applied Electronics,CAEP,P.O.Box 919-1015,Mianyang 621900,China

摘要: 通过基于随机矩阵理论的耦合模型，对不同频段电磁波环境中计算机机箱关键部位感应电压的统计分布进行了理论和实验分析，实验测量结果与理论分析结果非常一致。给出了随机耦合模型应用的简单例子，验证了随机耦合模型在宽频带电磁环境下系统级效应分析和预测的适用性。为电子设备（尤其大型的具有非平行面封装腔体电子设备）电磁环境效应分析提供了一种方法。
- 随机耦合模型 /
- 随机矩阵理论 /
- 微波腔体 /
- 感应电压 /
- 电磁环境效应
Abstract: The statistic characteristic of induced voltages at key points in computer box cavity is researched by means of experiments and the random coupling model （RCM）. It is shown that the experiment results generally agree with the theoretical results in trend. The applicability of RCM in analysis and predication of system-level electromagnetic environment effects is validated. A new method based on statistical electromagnetism should be exploited for the analyses of electromagnetic effects for large scale nonparallel surface electron device-box cavity systems.
- random coupling model /
- random matrix theory /
- microwave cavity /
- induced voltage /
- electromagnetic environment effects