Abstract: In linear induction accelerator (LIA), it is common for the intense electron beam time-resolved measurement system to be interfered by some short high-energy pulses. These transient pulses, which may affect both circuits and measurement system, are harmful to the electronic devices. The principle of time-resolved measurement system is introduced in this paper, while the formation causes and the suppression method of transient pulse interferences are analyzed. Arrangement of the beam parameter measurement system is also proposed. The effects on electron devices performance by transient pulse interferences and the preventive measures are discussed, too. By using optical fibers, which effectively reduced the delay jitter of narrow pulses, the reliability requirement of high-speed control signal propagation was fulfilled. To provide better protection for the electronic devices of beam parameter measurements, the anti-electromagnetic interference ability of the system was enhanced by compactly-embedded method. The reliability of the overall measurement system was significantly improved by adopting these measures.