Optical simulation software X-LAB and its applications
-
摘要: 针对自由电子激光、同步辐射光束线以及惯性约束聚变、极端条件物理过程等X射线光学系统,开发了具有独立知识产权的光学设计仿真软件X-LAB。基于光学衍射算法和序列式光线追迹算法,该软件集光线追迹仿真、矢量衍射仿真和复杂微结构特征光学元件版图绘制等功能,具有界面友好、操作便捷、包含特殊光学模块、支持“用户定制”功能等特点,为开展X射线光学系统、光学元件概念设计、优化和研制提供了不可或缺的平台。目前,X-LAB成功应用于能谱分辨率优于1000、能谱范围10~100 eV的北京同步辐射3B1无谐波单色化束线设计中及空间分辨优于6 μm,视场500 μm的惯性约束聚变物理过程X射线诊断光学系统——K-B镜系统的设计和优化中;具有复杂微结构光子筛版图绘制功能。Abstract: To design the monochorator beamlines of synchrotron radiation, develop X-FELs and make X-ray diagnoses of inertia confinement fusion as well as simulate dynamic process in extreme physical conditions, a useful tool and a platform, X-LAB, for optical design, optimization and simulation with the independent intellectual property rights was developed. With friendly interface, X-LAB has the functions of sequence ray-tracing, vector diffraction simulation and layout drawing of complex micro-structure optical elements. Also, it is easy to operate and can provide accustomed service, characteristic functions for users to freely design, optimize an optical system. Currently, X-LAB has been applied in designs and simulations of the 3B1 monochromatic beamline in Beijing Synchrotron Radiation Facility with spectral resolution 1000 and spectral range 10~100 eV, the X-ray diagnosis optical systems of inertia confinement fusion and dynamic process in extreme physical conditions, the KB microscope with spatial resolution up to 6 μm, and the layout drawing of photon sieves.
-
Key words:
- X-LAB /
- X-ray /
- ray-tracing /
- layout drawing /
- vector diffraction
-
图 1 针孔成像系统(透射式系统)与KB成像光学系统[12](反射式光学系统)
Figure 1. Pinhole imaging system (transmission system) and the Kirkpatrick-Baez (KB) imaging system (reflection system)
图 6 单色化束线仿真结果(散点分布): (a)单色器像平面处不放置狭缝,单色器像平面上的光强分布,从上至下三个光斑对应的光子能量分别为10.01, 10, 9.99 eV;(b)单色器像平面处不放置狭缝,后置聚焦像平面上光强分布;(c)单色器像平面处放置狭缝,只允许中心波长(10 eV) 的光束通过,单色器像平面上的光强分布;(d)单色器像平面处放置狭缝,只允许中心波长的光束通过,后置聚焦像平面上的光强分布
Figure 6. Simulation results of 3B1 monochromatic beamline: (a) and (b) respectively represent the scatter diagrams in the image plane of monochromator and in the image plane of the rear focusing part, without slit in the image plane of monochromator; (c) and (d) respectively represent the scatter diagrams in the image plane of monochromator and in the image plane of the rear focusing part, with a slit in the image plane of monochromator
表 1 3B1单色化束线光学系统参数设计
Table 1. Parameters of 3B1 monochromatic beamline
No. optical element main parameters @ 124 nm characteristic parameters/mm remarks object and image distance/mm incidence and reflection angle/(°) length and width/mm 1 toroidal mirror 1 23 600, 5500 84, 84 450, 55 meridional and sagittal radius 85 344, 1468 photon sieves 2 slit 1 - - - width 0.2 3 spherical mirror 1 3500, 350 84, 84 450, 60 radius 66 967 4 plane grating 450, 300 83.131 8, 72.868 2 400, 50 line spacing 300 line/mm 5 spherical mirror 2 450, 3500 84, 84 500, 60 radius 66 967 6 slit 2 - - - width 0.4 7 toroidal mirror 2 1250, 1250 84, 84 500, 60 meridional and sagittal radius 11 958, 211 -
[1] David Attwood. Soft X-rays and extreme ultraviolet radiation principles and applications[M]. Cambridge: Cambridge University Press, 2000. [2] Chrisp M P. X-ray spectrograph design[J]. Appl Opt, 1983, 22(10): 1508-1518. doi: 10.1364/AO.22.001508 [3] Manuel S R, Niccolo C, Fan Jiang, et al. SHADOW3: A new version of the synchrotron X-ray optics modelling package[J]. J Synchrotron Rad, 2011, 18(5): 708-716. doi: 10.1107/S0909049511026306 [4] Noda H, Namioka T, Seya M. Geometric theory of the grating[J]. Journal of the Optical Society of America, 1974, 64(8): 1031-1036. doi: 10.1364/JOSA.64.001031 [5] Cerrina F. SHADOW PRIMER[S]. 2010. [6] Erko A, Idir M, Krist T, et al. Modern developments in X-ray and neutron optics[M]. Berlin/Heidelberg: Springer-Verlag, 2008. [7] Rehanek J, Schäfers F, Erko A, et al. Simulations of diagnostic spectrometers for the European XFEL using the ray-trace tool RAY[C]//Proc of SPIE. 2011: 814109. [8] 魏来, 曹磊峰, 范伟, 等. 软X光谱学光子筛衍射特性的实验表征[J]. 强激光与粒子束, 2011, 23(2): 387-391. http://www.hplpb.com.cn/article/id/4976Wei Lai, Cao Leifeng, Fan Wei, et al. Measurement of diffraction properties of photon sieves applied to spectroscopy for soft X-ray. High Power Laser and Particle Beams, 2011, 23(2): 387-391 http://www.hplpb.com.cn/article/id/4976 [9] Mo Z, Zhang A, Cao X, et al. JASMIN: A parallel software infrastructure for scientific computing[J]. Front Comput Sci China, 2010, 4(4): 480-488. doi: 10.1007/s11704-010-0120-5 [10] 徐平均, 沈卫超, 廖丽. JaVis系统中的多分辨数据组织与交互可视化[J]. 计算机研究与发展, 2010, 47(6): 996-1004. https://www.cnki.com.cn/Article/CJFDTOTAL-JFYZ201006006.htmXu Pingjun, Shen Weichao, Liao Li. Multiresolution data organization and interactive visualization in JaVis. Journal of Computer Research and Development, 2010, 47(6): 996-1004 https://www.cnki.com.cn/Article/CJFDTOTAL-JFYZ201006006.htm [11] 温树槐, 丁永坤. 激光惯性约束聚变诊断学[M]. 北京: 国防工业出版社, 2012.Wen Shuhuai, Ding Yongkun. Laser inertial confinement fusion diagnostics. Beijing: National Defense Industry Press, 2012 [12] Kirkpatrick P, Baez A V. Formation of optical images by X-rays[J]. Journal of the Optical Society of America, 1948, 38(9): 766-774. doi: 10.1364/JOSA.38.000766 [13] 杨祖华. X-LAB v1.5使用手册[M]. 2016.Yang Zuhua. X-LAB v1.5 using manual. 2016 [14] 穆宝忠, 伊圣振, 黄圣铃, 等. ICF用Kirkpatrick-Baez显微镜光学设计[J]. 强激光与粒子束, 2008, 20(3): 409-412. http://www.hplpb.com.cn/article/id/3249Mu Baozhong, Yi Shengzhen, Huang Shenglin, et al. Optical design of Kirkpatrick-Baez microscope for ICF. High Power Laser and Particle Beams, 2008, 20(3): 409-412 http://www.hplpb.com.cn/article/id/3249 [15] 伊圣振, 魏来. 神光Ⅱ升级装置配套设备-KB型显微镜设计方案[R]. 2015.Yi Shengzhen, Wei Lai. the design scheme of the KB microscopy-SGⅡ-U related device. 2015 [16] 魏来, 崔明启, 赵屹东. 北京同步辐射3B1无谐波束线设计方案[R]. 2016.Wei Lai, Cui Mingqi, Zhao Yidong. The design scheme of nonharmonic 3B1 beamline in Beijing Synchrotron Radiation Facility. 2016 [17] 陈伯伦, 杨正华, 曹柱荣, 等. 同步辐射标定平面镜反射率不确定度分析方法研究[J]. 物理学报, 2010, 59(10): 7078-7085. https://www.cnki.com.cn/Article/CJFDTOTAL-WLXB201010058.htmChen Bolun, Yang Zhenghua, Cao Zhurong, et al. Reflectivity uncertainty analysis of planar mirror calibration in BSRF. Acta Physica Sinica, 2010, 59(10): 7078-7085 https://www.cnki.com.cn/Article/CJFDTOTAL-WLXB201010058.htm [18] Bai Q, Li L, Cheng F F, et al. Study on microstructure and mechanical properties of He and H ion irradiated 6H-SiC[J]. Nuclear Instruments & Methods in Physics Research, 2015, 365: 347-351.