Physical modeling and particle simulation technology of multi-pulse MILO cathode outgassing ionization
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摘要: 在磁绝缘线振荡器(MILO)阴极释气电离物理建模技术以及三维自洽运算基础上,研究了残存气体脉冲缩短,并分析了释气电离对多脉冲MILO运行的影响。把多脉冲释气分为脉冲内阴极释气脉间残余气体累积两个部分,研究了不同释气率以及残余气体对整个器件的运行产生影响。计算结果表明,多脉冲运行MILO最主要影响因素是释气后电离产生的正离子,当正离子密度超过发射电子密度时,束波互作用被破坏。Abstract: The commutation phenomena produced by cathode outgassing ionization is a possible factor to limit work performance of magnetically insulated transmission line oscillator (MILO), and also is the main obstacle to limit its repeat frequency. In this paper, physical modeling technology of MILO cathode outgassing ionization phenomena and three-dimensional particle simulation are presented. The relation between remaining gas of previous outgassing and pulse duration is analyzed. When the number of positive ions is greater than that of electrons the plasma caused by the ionization will rapidly reduce microwave output power.
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表 1 不同密度残余气体脉冲缩短时间
Table 1. Different remaining gas density vs pulse shorten time
gas density/m−3 pulse shorten time/ns 5.02×1021 3 2.51×1021 5 1.004×1021 10 5.02×1020 20 2.51×1020 70 5.02×1019 95 2.51×1019 105 5.02×1018 175 5.02×1017 220 -
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