Z-pinch plasma spectral imaging with uniform dispersion crystal
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摘要: 为了诊断Z箍缩等离子体X射线相关信息,利用自聚焦和均匀色散原理,研制了一种新型的均匀色散弯晶谱仪。晶体分析器采用-石英(1010),布拉格角为43.4~72.7,利用有效面积为10 mm50 mm的X射线胶片接收光谱信号,实验在中国工程物理研究院阳加速器装置上进行,摄谱元件获得了Z箍缩铝丝阵等离子体的类H及类He谱线。实验结果表明:谱线分布遵循均匀色散条件,所研制均匀色散弯晶谱仪线色散率为-116.198 mm/nm,与理论值-120 mm/nm的相对误差为3.168%,能够用于Z箍缩等离子体X射线的光谱学研究。Abstract: Based on the self-focusing and uniform dispersion principle, a spectrograph with uniform dispersion bent crystal was developed for Z-pinch plasma X-ray diagnosis. -quartz (1010) crystal was used as dispersion element and the Bragg angle of the crystal analyzer ranged from 43.4 to 72.7. The X-ray film was employed to receive the spectra with an effective area of 10 mm50 mm. The experiment was carried out at the Yang accelerator in China Academy of Engineering Physics. The H-like and He-like spectra of aluminum Z-pinch plasma were obtained. The distribution of aluminum spectra satisfies the uniform dispersion condition. The linear dispersion of the developed spectrograph is -116.198 mm/nm and the error is only 3.168% relative to the theoretical value of -120 mm/nm. The experimental results demonstrate that the uniform dispersion bent crystal spectrograph is suitable for Z-pinch plasma X-ray spectroscopy diagnosis.
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Key words:
- z-pinch plasma /
- bent crystal /
- uniform dispersion /
- crystal analyzer /
- x-ray diagnosis
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