电子弛豫过程对重复频率高功率微波大气击穿的影响
Effect of electronic relaxation process on air breakdown caused by repetition frequency HPM
-
摘要: 研究了重复频率高功率微波脉冲作用下的大气击穿。分析了重复频率脉冲作用下电子的弛豫过程，对脉冲间隔时间内电子温度和自由电子密度的变化规律进行了研究，得出了电子温度弛豫时间远小于电子密度弛豫时间的结论。分析了电子弛豫过程的附着效应和复合效应，给出了高功率微波重复频率脉冲作用下发生大气击穿的条件和重复频率高功率微波大气击穿的电子数密度方程。Abstract: Air breakdown caused by repetition frequency high power microwave (HPM) has been investigated. The electronic relaxation process affected by repetition frequency pulses has been analyzed, and variations regulation of the electron temperature and free electron density pulsein interval time has been studied, It is found that the electron temperature relaxation time is far less than the electron density relaxation time. This paper analyzes the attachment and recombination effects in the electronic relaxation process, and present the occurrence condition of air breakdown caused by repetition frequency HPM, and the electronic density equation of the air breakdown.
-
点击查看大图
计量
- 文章访问数: 2254
- HTML全文浏览量: 297
- PDF下载量: 471
- 被引次数: 0
下载:
