Exploratory research on off-line diagnosis method of ion beam profile

A novel off-line diagnosis method for ion beams of the sealed tube neutron generator is introduced, which is based on secondary ion mass spectrometry (SIMS). The method has high resolution and can provide intensity distribution of ion beam profile and ion composition. The feasibility of the method was analyzed and discussed by numerical simulation, and verified by experiment. The preliminary experimental results indicate the hydrogen distribution and titanium distribution. This method can be used to diagnose the ion beam profile for the sealed tube neutron generator, and can provide confirmation and complement for other diagnostic methods.