CMOS detector systems for soft X-ray imaging diagnosis

The CMOS detector systems have been introduced for diagnosing on-line soft X-ray imaging signals by coupling fiber optic plate covered scintillator and CMOS image sensor. The thickness of CsI scintillator was confirmed to be 30 m according to XOP program calculation in 1-10 keV energy range. Based on the micro-point X-ray source, the spatial resolution of the systems was found to be 60 m using Typ 18-d standard resolution test target. The CMOS detector systems were applied in hydromechanical instability and mixture research on shenguang-Ⅲ prototype facility to diagnose Ti spectra of backlit source. The H-like and He-like spectra were recorded clearly. The data analysis showed the experimental spectral resolution (/) that was about 442 nearly accorded with that of the theoretical model. The CMOS detector systems are suitable for universities and scientific academies in on-line soft X-ray diagnosis since they have obvious advantages such as small volume, high performance and low price.