Eliminating phase error caused by multi-path effect for phase measuring profilometry</p>

Yang Yang; Long Yunfei; Wu Wei; Yang Xiaomin; Liu Kai

doi:10.11884/HPLPB201527.041013

Volume 27 Issue 04

Mar. 2015

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Article Navigation > High Power Laser and Particle Beams > 2015 > 27(04): 041013

Wu Hanyu, Zhang Xinjun, Wang Liangping, et al. Restraint of focus spot drift of electron-beam in bremsstrahlung radiation[J]. High Power Laser and Particle Beams, 2015, 27: 075105. doi: 10.11884/HPLPB201527.075105

Citation:

Yang Yang, Long Yunfei, Wu Wei, et al. Eliminating phase error caused by multi-path effect for phase measuring profilometry

[J]. High Power Laser and Particle Beams, 2015, 27: 041013. doi: 10.11884/HPLPB201527.041013

Citation:

Yang Yang, Long Yunfei, Wu Wei, et al. Eliminating phase error caused by multi-path effect for phase measuring profilometry

[J]. High Power Laser and Particle Beams, 2015, 27: 041013. doi: 10.11884/HPLPB201527.041013

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Eliminating phase error caused by multi-path effect for phase measuring profilometry

doi: 10.11884/HPLPB201527.041013

1.
School of Electrical Engineering and Information,Sichuan University,Chengdu 610065,China;
2.
College of Electronics and Information Engineering,Sichuan University,Chengdu 610065,China

Received Date: 2014-11-23
Rev Recd Date: 2014-12-23
Publish Date: 2015-03-23

Abstract

Abstract

The multi-path effect can cause undesirable phase error in regions with dramatically varied albedo. This paper proposes an effective method to correct such an error. The difference map of modulation is generated to precisely detect regions affected by the multi-path effect, and the phase error in the detected regions is corrected according to neighbor phase. Experimental results demonstrate the validity of the proposed method and show a reduction by 57.3% in the root mean square of phase errors.
- phase measuring profilometry,
- multi-path effect,
- phase error correction,
- CCD imaging,
- interpolation

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