Gu Li, Zong Fangke, Li Xiang, et al. Influence of photoelectron energy and angular distribution and space charge effect on streak cameras[J]. High Power Laser and Particle Beams, 2015, 27: 062011. doi: 10.11884/HPLPB201527.062011
Citation:
Gu Li, Zong Fangke, Li Xiang, et al. Influence of photoelectron energy and angular distribution and space charge effect on streak cameras[J]. High Power Laser and Particle Beams, 2015, 27: 062011. doi: 10.11884/HPLPB201527.062011
Gu Li, Zong Fangke, Li Xiang, et al. Influence of photoelectron energy and angular distribution and space charge effect on streak cameras[J]. High Power Laser and Particle Beams, 2015, 27: 062011. doi: 10.11884/HPLPB201527.062011
Citation:
Gu Li, Zong Fangke, Li Xiang, et al. Influence of photoelectron energy and angular distribution and space charge effect on streak cameras[J]. High Power Laser and Particle Beams, 2015, 27: 062011. doi: 10.11884/HPLPB201527.062011
Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province,College of Optoelectromic Engineering,Shenzhen University,Shenzhen 518060,China
Based on study of femtosecond streak camera system and femtosecond electron diffraction system, the influence of photoelectron energy, angular distribution and space charge effect on photoelectron time and energy spread in photocathode-mesh acceleration region is analyzed using Monte Carlo simulation. When the ultraviolet and soft X-ray incident photocathode, the time spread values of six types of photoelectron initial energy distribution is given. The relationship of electronic time spread between emission current density and accelerating field is analyzed. Electrons redistribute themselves inside the pulse, a linear velocity chirp develops on the electron pulse in acceleration region, the energy dispersion changes differently from that in free propagation region. The analysis and findings are useful for the study of ultrafast electronic propagation dynamics and the design of femtosecond streak camera, femtosecond electron diffraction and energy compensation components.