Influence of frequency and microwave repetition rate on thermal damage process of PIN limiter

Zhao Zhenguo; Zhou Haijing; Ma Hongge; Wang Yan

doi:10.11884/HPLPB201527.103239

Volume 27 Issue 10

Oct. 2015

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Article Navigation > High Power Laser and Particle Beams > 2015 > 27(10): 103239

Zhang Fan, Huang Xiuguang, Shu Hua, et al. Characteristics of dynamic fracture of aluminum and metallographic analysis of recovered samples in laser experiments[J]. High Power Laser and Particle Beams, 2015, 27: 071006. doi: 10.11884/HPLPB201527.071006

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Zhao Zhenguo, Zhou Haijing, Ma Hongge, et al. Influence of frequency and microwave repetition rate on thermal damage process of PIN limiter[J]. High Power Laser and Particle Beams, 2015, 27: 103239. doi: 10.11884/HPLPB201527.103239

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Influence of frequency and microwave repetition rate on thermal damage process of PIN limiter

doi: 10.11884/HPLPB201527.103239

Zhao Zhenguo^{1,4
,
,},
Zhou Haijing^1,2,4,
Ma Hongge^3,4,
Wang Yan^3,4

1.
Software Center for High Performance Numerical Simulation,CAEP,Beijing 100088,China;
2.
Institute of Applied Physics and Computational Mathematics,Beijing 100088,China;
3.
Institute of Applied Electronics,CAEP,Mianyang 621900,China;
4.
Complicated Electromagnetic Environment Laboratory,CAEP,Mianyang 621900,China

Received Date: 2015-05-05
Rev Recd Date: 2015-08-20
Publish Date: 2015-10-13

Abstract

Abstract

Based on the PIN limiter circuit /device physics mixed mode model, considering the high electric field and high temperature devices multi-physical features under high-power microwave, we simulate the influence of frequency and microwave pulse repetition rate on thermal damage process of PIN limiter. Numerical simulation results show that different frequency microwave pulses damaging the PIN limiter exist a turning point frequency. Microwave pulses near the turning point frequency require more energy or pulse width to damage the device. After one pulse function on the device, the peak temperature of the device declines fast and it is similar to negative exponent relationship. It is easier when the device is in a high temperature. Heat accumulation effect makes it easier on damaging PIN limiter than the single pulse microwave.
- microwave frequency,
- pulse repeating rate,
- heat accumulation damage,
- PIN limiter

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