Sun Fengjie, Deng Jianhong. Field-circuit co-simulation of electromagnetic pulse interference to electronics[J]. High Power Laser and Particle Beams, 2015, 27: 124003. doi: 10.11884/HPLPB201527.124003
Citation:
Sun Fengjie, Deng Jianhong. Field-circuit co-simulation of electromagnetic pulse interference to electronics[J]. High Power Laser and Particle Beams, 2015, 27: 124003. doi: 10.11884/HPLPB201527.124003
Sun Fengjie, Deng Jianhong. Field-circuit co-simulation of electromagnetic pulse interference to electronics[J]. High Power Laser and Particle Beams, 2015, 27: 124003. doi: 10.11884/HPLPB201527.124003
Citation:
Sun Fengjie, Deng Jianhong. Field-circuit co-simulation of electromagnetic pulse interference to electronics[J]. High Power Laser and Particle Beams, 2015, 27: 124003. doi: 10.11884/HPLPB201527.124003
In order to make relatively accurate analysis for electromagnetic interference problem occurred in interior circuit of equipment chassis, this paper adopts an analysis method based on field-circuit co-simulation to realize electromagnetic interference effect analysis for chassis the interior circuit by taking chassis interior circuit as an example. It is discovered that the electromagnetic interference may cause the interior circuit to produce some disturbance effects such as logic level flip, which provides a reference for research on operating characteristics of circuit in electromagnetic interference environment.