Chen Yunbin, Chen Si, Li Jing. Form and correction of a new type of artifact induced by beam hardening[J]. High Power Laser and Particle Beams, 2016, 28: 104001. doi: 10.11884/HPLPB201628.160047
Citation:
Chen Yunbin, Chen Si, Li Jing. Form and correction of a new type of artifact induced by beam hardening[J]. High Power Laser and Particle Beams, 2016, 28: 104001. doi: 10.11884/HPLPB201628.160047
Chen Yunbin, Chen Si, Li Jing. Form and correction of a new type of artifact induced by beam hardening[J]. High Power Laser and Particle Beams, 2016, 28: 104001. doi: 10.11884/HPLPB201628.160047
Citation:
Chen Yunbin, Chen Si, Li Jing. Form and correction of a new type of artifact induced by beam hardening[J]. High Power Laser and Particle Beams, 2016, 28: 104001. doi: 10.11884/HPLPB201628.160047
X-ray beam hardening is one of the physical processes that degrade the quality of ICT reconstructed images. Commonly, beam hardening artifacts perform as cupping artifacts and streak artifacts. This paper illustrates and demonstrates a new type of beam hardening artifact. It is closely related to the structure of object. In addition, it is obscure between artifacts and real structures due to regular distribution of artifacts. Linear correction method was applied to suppress artifacts. The quality of reconstructed image is increased, and the accuracy of dimensional metrology is also improved.