Volume 28 Issue 12
Nov.  2016
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Xue Chuang, Ding Ning, Xiao Delong, et al. Lumped circuit model for the PTS driving Z pinch load implosion[J]. High Power Laser and Particle Beams, 2016, 28: 125004. doi: 10.11884/HPLPB201628.160138
Citation: Xue Chuang, Ding Ning, Xiao Delong, et al. Lumped circuit model for the PTS driving Z pinch load implosion[J]. High Power Laser and Particle Beams, 2016, 28: 125004. doi: 10.11884/HPLPB201628.160138

Lumped circuit model for the PTS driving Z pinch load implosion

doi: 10.11884/HPLPB201628.160138
  • Received Date: 2016-05-13
  • Rev Recd Date: 2016-07-11
  • Publish Date: 2016-12-15
  • To study conveniently the electromagretic coupling of Primary Test Stand (PTS) with Z pinch load, based on experimental electrical data analysis and full circuit simulations, a simple lumped circuit model (LCM-PTS) was established and the lumped parameters were discussed in detail. The equivalent voltage was obtained by constructing the open circuit voltage at the tri-plate output water transmission line, which could be fitted by a function of 3.3sin2(t/205). The space electrons current loss in the magnetically insulated transmission line was simplified by flow impedance model. Simulations were carried out by coupling the LCM-PTS model with a 0-dimensional dynamic model of Z pinch loads, and the load currents agreed well with the experimental results.
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