In-situ sputtering type single-try discriminator circuit

Wang Yuhang; Gao Yang; Han Bin; Jia Le

doi:10.11884/HPLPB201628.160140

Volume 28 Issue 11

Oct. 2016

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Article Navigation > High Power Laser and Particle Beams > 2016 > 28(11): 114101

Liu Jiao, Yan Liping, Li Bin, et al. Artificial neural network modeling of component nonlinear behavior and application in conducted interference analysis[J]. High Power Laser and Particle Beams, 2015, 27: 103212. doi: 10.11884/HPLPB201527.103212

Citation:

Wang Yuhang, Gao Yang, Han Bin, et al. In-situ sputtering type single-try discriminator circuit[J]. High Power Laser and Particle Beams, 2016, 28: 114101. doi: 10.11884/HPLPB201628.160140

Citation:

Wang Yuhang, Gao Yang, Han Bin, et al. In-situ sputtering type single-try discriminator circuit[J]. High Power Laser and Particle Beams, 2016, 28: 114101. doi: 10.11884/HPLPB201628.160140

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In-situ sputtering type single-try discriminator circuit

doi: 10.11884/HPLPB201628.160140

1.
School of Information Engineering,Southwest University of Science and Technology,Mianyang 621010,China;
2.
Institute of Electronic Engineering,China Academy of Engineering Physics,Mianyang 621999,China;
3.
National Key Laboratory of Fundamental Science of Micro/Nano-Device and System Technology,Chongqing University,Chongqing 400044,China;
4.
State Key Laboratory of Particle Detection and Electronics,Institute of High Energy Physics,Chinese Academy of Sciences,Beijing 100049,China

Received Date: 2016-05-17
Rev Recd Date: 2016-07-12
Publish Date: 2016-11-15

Abstract

Abstract

As the structure of discriminator in the current micro-electromechanical system combination lock is complex and the reliability of electronic combination locks is poor, we designed an N bit in-situ sputtering single-try discrimination circuit to solve these problems. The N bit discrimination circuit is composed of 2N (N-stage, two switches per stage) sputtering type OFF-ON switches and formed by alternative logic of each stage and N-stage series. The sputtering type OFF-ON switches (the one-way switch of the OFF state to ON state is irreversible) and the fuse having a fusing characteristic are connected by the corresponding relationship between setting password and the circuit to form in-situ sputtering and single-try solid combination lock which can be used in high security key systems and facilities. In order to ensure a space between the metal exploding foil and the interdigital electrode, three different micromachining process methods of the discrimination circuit are presented.
- micro-electro-mechanical systems,
- sputtering,
- discriminator circuit,
- combination lock,
- single-try

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