Design of beam phase measurement electronics system based on sub-sampling technology

Peng Wei; Wu Bing; Xu Taoguang; Li Wujian; Li Peng

doi:10.11884/HPLPB201729.160412

Volume 29 Issue 06

Apr. 2017

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Article Navigation > High Power Laser and Particle Beams > 2017 > 29(06): 065106

Bi Bi, Zhou Weimin, Shan Lianqiang, et al. Density diagnosis based on ps-duration-pulse X-ray backlighting for fast ignition compression[J]. High Power Laser and Particle Beams, 2020, 32: 042001. doi: 10.11884/HPLPB202032.200050

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Peng Wei, Wu Bing, Xu Taoguang, et al. Design of beam phase measurement electronics system based on sub-sampling technology[J]. High Power Laser and Particle Beams, 2017, 29: 065106. doi: 10.11884/HPLPB201729.160412

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Design of beam phase measurement electronics system based on sub-sampling technology

doi: 10.11884/HPLPB201729.160412

Peng Wei^{1
,
,},
Wu Bing¹,
Xu Taoguang²,
Li Wujian¹,
Li Peng²

1.
The 38th Research Institute of China Electronics Technology Group Corporation,Hefei 230088,China;
2.
Dongguan Neutron Science Center,Institute of High Energy Physics,Chinese Academy of Sciences,Dongguan 523803,China Abstract:

Received Date: 2016-07-16
Rev Recd Date: 2016-10-25
Publish Date: 2017-06-15

Abstract

Abstract

Sub-sampling technology has been adopted to realize fully-digitalized beam phase measurement electronics system for linac in China Spallation Neutron Source(CSNS). This paper introduces measurement principle and operation procedure of the system and describes analog signal processing, sampling and frequency module. It also presents the experimental results of measuring 324 MHz/100 mVpp sine wave, which achieves phase resolution less than 0.1 and non-uniformity between channels limited in 0.2, satisfying the requirements of system.
- beam phase measurement,
- sub-sampling,
- ADC,
- China Spallation Neutron Source(CSNS)

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通讯作者: 陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

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Design of beam phase measurement electronics system based on sub-sampling technology

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Design of beam phase measurement electronics system based on sub-sampling technology

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