Volume 29 Issue 11
Nov.  2017
Turn off MathJax
Article Contents
Cai Beibing, Yu Daojie, Zhou Dongfang, et al. Analysis of air breakdown relaxation time of high power microwave based on O- detachment[J]. High Power Laser and Particle Beams, 2017, 29: 113004. doi: 10.11884/HPLPB201729.170265
Citation: Cai Beibing, Yu Daojie, Zhou Dongfang, et al. Analysis of air breakdown relaxation time of high power microwave based on O- detachment[J]. High Power Laser and Particle Beams, 2017, 29: 113004. doi: 10.11884/HPLPB201729.170265

Analysis of air breakdown relaxation time of high power microwave based on O- detachment

doi: 10.11884/HPLPB201729.170265
  • Received Date: 2017-06-28
  • Rev Recd Date: 2017-07-21
  • Publish Date: 2017-11-15
  • Based on the global model, within O- detachment process, the repetition frequency pulse relaxation model of high power microwave is rebuilt, and the relaxation process characteristics are analyzed. The relationship between electron density with time is simulated on different attachment frequency, detachment frequency and initial electron density. The results show that the electron density relaxation process is divided into the rapid-decay process and slow-decay process; electron density is significantly improved at the later stage of relaxation process. Detachment frequency and attachment frequency have opposite effects on the relaxation process. The higher the detachment frequency is, the higher electron density of the slow-decay process is, but electron density of the rapid-decay process doesnt change significantly. The higher the attachment frequency is, the sharper the change of the electron density on the rapid-decay process and the lower electron density in the slow-decay process is.
  • loading
  • 加载中

Catalog

    通讯作者: 陈斌, bchen63@163.com
    • 1. 

      沈阳化工大学材料科学与工程学院 沈阳 110142

    1. 本站搜索
    2. 百度学术搜索
    3. 万方数据库搜索
    4. CNKI搜索
    Article views (1101) PDF downloads(229) Cited by()
    Proportional views
    Related

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return