Lei Chengqiang, Wang Yuefeng, Yin Zhiyong, et al. Effects of microlens array positon error on diode laser beam homogenization[J]. High Power Laser and Particle Beams, 2015, 27: 091002. doi: 10.11884/HPLPB201527.091002
Citation: Ji Kaifu, Wei Guanghui, Pan Xiaodong, et al. Calculation model of critical radiated interference E-field intensity in reverberation chamber[J]. High Power Laser and Particle Beams, 2018, 30: 013205. doi: 10.11884/HPLPB201830.170291

Calculation model of critical radiated interference E-field intensity in reverberation chamber

doi: 10.11884/HPLPB201830.170291
  • Received Date: 2017-07-14
  • Rev Recd Date: 2017-09-07
  • Publish Date: 2018-01-15
  • In order to solve the problem of the poor correlation of the radiation susceptibility test results between uniform field and reverberation chamber, this paper analyzes the statistical characteristics of the E-field rectangular component and the antenna's received power in reverberation chamber with statistical theory, and a calculation model of critical radiated interference E-field intensity base on the failure probability of equipment under test is derived. To verify the correctness of the calculation model, the ETS 3142E antenna is taken as equipment under test to perform the critical radiated interference E-field intensity test in uniform field and reverberation chamber. The experiment result shows that the critical radiated interference E-field intensity obtained by the calculation model is well consistent with the test result in uniform field, and the average relative error can be decreased to 2 dB, which indicates that this calculation model can be applied to' actual radiation susceptibility test.
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