Influence of pulse interval on thermal damage process of PIN limiter

Wang Ming; Ma Hongge

doi:10.11884/HPLPB201830.170426

Volume 30 Issue 6

Jun. 2018

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Wang Ming, Ma Hongge. Influence of pulse interval on thermal damage process of PIN limiter[J]. High Power Laser and Particle Beams, 2018, 30: 063002. doi: 10.11884/HPLPB201830.170426

Citation:

Wang Ming, Ma Hongge. Influence of pulse interval on thermal damage process of PIN limiter[J]. High Power Laser and Particle Beams, 2018, 30: 063002. doi: 10.11884/HPLPB201830.170426

Wang Ming, Ma Hongge. Influence of pulse interval on thermal damage process of PIN limiter[J]. High Power Laser and Particle Beams, 2018, 30: 063002. doi: 10.11884/HPLPB201830.170426

Citation:

Wang Ming, Ma Hongge. Influence of pulse interval on thermal damage process of PIN limiter[J]. High Power Laser and Particle Beams, 2018, 30: 063002. doi: 10.11884/HPLPB201830.170426

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Influence of pulse interval on thermal damage process of PIN limiter

doi: 10.11884/HPLPB201830.170426

Wang Ming^{1, 3
,},
Ma Hongge^{1, 2}

1.
Science and Technology on High Power Microwave Laboratory, Institute of Applied Electronics, CAEP, Mianyang 621900, China
2.
Complicated Electromagnetic Environment Laboratory, CAEP, Mianyang 621900, China
3.
Graduate School of China Academy of Engineering Physics, Beijing 100088, China

Received Date: 2017-11-01
Rev Recd Date: 2017-12-18
Publish Date: 2018-06-15

Abstract

Abstract

Based on the device physics simulation, focusing on the influence of pulse interval on thermal damage process of PIN limiter, the peak temperature of combined pulses with different pulse interval from 1 to 20 ns is studied. Numerical simulation results show that the pulse interval in which the device temperature rises most has a positive relationship with intrinsic region thickness. The thermal breakdown mechanism is analyzed. It is the spike leakage of the second sub-pulse that makes the temperature rise speed up. And the high temperature of the P-type region also causes the electrothermal feedback which makes it easier to get higher temperature.
- PIN limiter,
- combined pulse,
- thermal damage,
- microwave pulse

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References(8)

References

[1]	Bera S C, Bharadhwaj P S. Insight into PIN diode behaviour leads to improved control circuit[J]. IEEE Trans Circuits & Systems Ⅱ Express Briefs, 2005, 52(1): 1-4.
[2]	Obreja V V N, Nuttall K I. On the high temperature operation of high voltage power devices[C]//International Semiconductor Conference. 2002, 2: 253-256.
[3]	李勇, 宣春, 谢海燕, 等. 电磁脉冲作用下PIN二极管的响应[J]. 强激光与粒子束, 2013, 25(8): 2061-2066. doi: 10.3788/HPLPB20132508.2061 Li Yong, Xuan Chun, Xie Haiyan, et al. Response of PIN diode to electromagnetic pulse. High Power Laser and Particle Beams, 2013, 25(8): 2061-2066 doi: 10.3788/HPLPB20132508.2061
[4]	赵振国, 周海京, 马弘舸, 等. 微波脉冲频率与重频对限幅器热损伤效应的影响[J]. 强激光与粒子束, 2015, 27: 103239. doi: 10.11884/HPLPB201527.103239 Zhao Zhenguo, Zhou Haijing, Ma Hongge, et al. Influence of frequency and microwave repetition rate on thermal damage process of PIN limiter. High Power Laser and Particle Beams, 2015, 27: 103239 doi: 10.11884/HPLPB201527.103239
[5]	陈曦, 杜正伟, 龚克. 脉冲宽度对PIN限幅器微波脉冲热效应的影响[J]. 强激光与粒子束, 2010, 22(7): 1602-1606. http://www.hplpb.com.cn/article/id/4359 Chen Xi, Du Zhengwei, Gong Ke. Effect of pulse width on thermal effect of microwave pulse on PIN limiter. High Power Laser and Particle Beams, 2010, 22(7): 1602-1606 http://www.hplpb.com.cn/article/id/4359
[6]	Synopsys Inc. Sentaurus device user guide[M]. California: Synopsys Inc, 2010: 316-344.
[7]	赵振国, 马弘舸, 赵刚, 等. PIN限幅器微波脉冲热损伤温度特性[J]. 强激光与粒子束, 2013, 25(7): 1741-1746. doi: 10.3788/HPLPB20132507.1741 Zhao Zhenguo, Ma Hongge, Zhao Gang, et al. Characteristics of temperature during PIN limiter thermal damage caused by microwaves. High Power Laser and Particle Beams, 2013, 25(7): 1741-1746 doi: 10.3788/HPLPB20132507.1741
[8]	汪海洋, 李家胤, 周翼鸿, 等. PIN限幅器PSpice模拟与实验研究[J]. 强激光与粒子束, 2006, 18(1): 88-92. http://www.hplpb.com.cn/article/id/2437 Wang Haiyang, Li Jianyin, Zhou Yihong, et al. Experimental study and PSpice simulation of PIN diode limiter. High Power Laser and Particle Beams, 2006, 18(1): 88-92 http://www.hplpb.com.cn/article/id/2437